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> Jeol jem-2000FX transmission electron microscope tem
Jeol jem-2000FX transmission electron microscope tem
JOEL JEM-2000FX transmission electron microscope (TEM/STEM)
Bright field and dark-field imaging in transmission or scanning transmission modes
Nano-diffraction and convergent beam diffraction
XEDS, SAED, CBED, STEM, Diffraction Contrast Imaging, Low dose imaging
Point-to-point resolution of 0.28 nm, lattice fringes at 0.20 nm resolution
You will need to pick it up or arrange freight service company.
